ST7PMC2N6B6(2004) View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

ST7PMC2N6B6
(Rev.:2004)

8-BIT MCU WITH NESTED INTERRUPTS, FLASH, 10-BIT ADC, BRUSHLESS MOTOR CONTROL, FIVE TIMERS, SPI, LINSCI™

STMicroelectronics 

ST7MC1/ST7MC2

10-BIT ADC CHARACTERISTICS (Cont’d)

ADC Accuracy with VDD=5.0V

Symbol

|ET|

|EO|

|EG|

|ED|

|EL|

Parameter

Total unadjusted error 1)

Offset error 1)

Gain Error 1)

Differential linearity error 1)

Integral linearity error 1)

Conditions

Typ

4

2.5

VAREF=3.0V to 5.0V, fCPU=8MHz,

fADC=4MHz, RAIN<10kΩ

2

2

2

Max

4 2)

4 2)

4.52)

4.52)

Unit

LSB

Notes:

1. ADC Accuracy vs. Negative Injection Current: Injecting negative current may reduce the accuracy of the conversion

being performed on another analog input. The effect of negative injection current on analog pins is specified in Section

11.14.

Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 11.8 does not affect the ADC

accuracy.

2. Data based on characterization results, monitored in production.

Figure 155. ADC Accuracy Characteristics

1023

1022

1021

7

6

5

4

3

2

1

Digital Result ADCDR

1LSBIDEA

L

=

V-----D----D-----A------–----V-----S----S----A---

1024

(2)

ET

EO

EL

1 LSBIDEAL

0

1234567

VSSA

EG

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

(3)

(1)

ED

ET=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset Error: deviation between the first actual

transition and the first ideal one.

EG=Gain Error: deviation between the last ideal

transition and the last actual one.

ED=Differential Linearity Error: maximum deviation

between actual steps and the ideal one.

EL=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

1021 1022 1023 1024

VAREF

Vin (LSBIDEAL)

Notes:

1. ADC Accuracy vs. Negative Injection Current:

For IINJ-=0.8mA, the typical leakage induced inside the die is 1.6µA and the effect on the ADC accuracy is a loss of 4 LSB

for each 10KΩ increase of the external analog source impedance. This effect on the ADC accuracy has been observed

under worst-case conditions for injection:

- negative injection

- injection to an Input with analog capability, adjacent to the enabled Analog Input

- at 5V VDD supply, and worst case temperature.

2. Data based on characterization results with TA=25°C.

3. Data based on characterization results over the whole temperature range, monitored in production.

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