STTH5R06D/FP/B/G
Fig. 3-1: Relative variation of thermal impedance
junction to case versus pulse duration (TO-220AC,
DPAK, D2PAK).
Zth(j-c)/Rth(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
0.4 δ = 0.2
0.3 δ = 0.1
0.2
Single pulse
0.1
0.0
1.E-03
1.E-02
tp(s)
T
1.E-01
δ=tp/T
tp
1.E+00
Fig. 3-2: Relative variation of thermal impedance
junction to case versus pulse duration
(TO-220FPAC).
Zth(j-c)/Rth(j-c)
1.0
0.9
0.8
0.7
0.6 δ = 0.5
0.5
0.4
0.3 δ = 0.2
0.2 δ = 0.1
0.1
Single pulse
0.0
1.E-03
1.E-02
tp(s)
1.E-01
T
δ=tp/T
1.E+00
tp
1.E+01
Fig. 4: Peak reverse recovery current versus
dIF/dt (90% confidence).
IRM(A)
22
VR=400V
20
Tj=125°C
18
16
14
12
10
8
6
4
2
0
0
IF=0.5 x IF(av)
IF=0.25 x IF(av)
IF=IF(av)
dIF/dt(A/µs)
200
400
600
IF=2 x IF(av)
800
1000
Fig. 5: Reverse recovery time versus dIF/dt
(90% confidence).
trr(ns)
80
70
60
50
40
30
20
10
0
0
IF=2 x IF(av)
IF=IF(av)
IF=0.5 x IF(av)
dIF/dt(A/µs)
200
400
600
VR=400V
Tj=125°C
800
1000
Fig. 6: Reverse recovery charges versus dIF/dt
(90% confidence).
Qrr(nC)
350
300
VR=400V
Tj=125°C
IF=2 x IF(av)
250
200
150
IF=IF(av)
IF=0.5 x IF(av)
100
50
0
0
dIF/dt(A/µs)
200
400
600
800
1000
Fig. 7: Softness factor versus dIF/dt (typical
values).
S factor
0.70
0.65
0.60
IF=IF(av)
VR=400V
Tj=125°C
0.55
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0
200
dIF/dt(A/µs)
400
600
800
1000
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