CL-PS7111
Low-Power System-on-a-Chip
6.6.1
Oscillator and PLL Bypass Mode
This mode is selected by NTEST0 = 1, NTEST1 = 0.
In this mode all the internal oscillators and PLL are disabled and the appropriate crystal oscillator pins
become the direct external oscillator inputs bypassing the oscillator and PLL. MOSCIN must be driven by
a 36.864-MHz clock source and RTCOUT by a 32.768-kHz source. In addition the OSCEN (oscillator
enable) signal is multiplexed out on the PD[0] pin and can be used to control the external oscillator. The
functionality of the CL-PS7111 is not affected in any other way during this test mode.
6.6.2
Functional (EPB) Test Mode
This mode is selected by NTEST0 = 0, NTEST1 = 1, Latched NURESET = 1.
The functional EPB (embedded peripheral bus) Test mode is used for running test patterns, both through
the EPB external test interface and other patterns, and is used to test individual peripherals and the
ARM710a microprocessor. The PLL is automatically bypassed in this mode. In this mode various pins are
used as control inputs or outputs, as listed in Table 6-3. Note that in EPB test mode, the chip only wakes
up from the standby state using the external wake-up input. In this mode, the OR function of the Port A
inputs which can be used to wake-up the chip is not available.
Table 6-3. EPB Test Mode Signal Assignment
Signal
TSTA
TSTB
TSTSTART
TSTDIRCLK
TSTVCOUNT
TACK
I/O
Pin Function
I
PA0 EPB test control A
I
PA1 EPB test control B
I
PA2 Fast start speed up RTC divider chain
I
PA3 Insertion point for EPB test clock
I
PA4 Video Address counter increments faster
O
word EPB test acknowledge output
6.6.3
Oscillator and PLL Test Mode
This mode is selected by NTEST0 = 0, NTEST1 = 1, Latched NURESET = 0.
This test mode enables the main oscillator and output various buffered clock and test signals derived from
the main oscillator, PLL, and 32-kHz oscillator. All internal logic in the CL-PS7111 is static and isolated
from the oscillators with the exception of the 6-bit ripple counter used to generate 576-kHz and the real-
time clock divide chain. Port A is used to drive the inputs of the PLL directly and the various clock and PLL
outputs are monitored on the COL pins. Table 6-4 defines the CL-PS7111 signal pins used in this test
mode. This mode is only intended to allow tests of the oscillators and PLL.
Table 6-4. Oscillator and PLL Test Mode Signals
Signal
TSELa
XTALONa
I/O Pin Function
I
PA5 PLL test select
I
PA4 Enable to oscillator circuit
88
ELECTRICAL SPECIFICATIONS
September 1997
PRELIMINARY DATA BOOK v2.0