LH28F800BGHE-TL12 查看數據表（PDF） - Sharp Electronics

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LH28F800BGHE-TL12

8 M-bit (512 kB x 16) SmartVoltage Flash Memories

Sharp Electronics 

1.3 V

1N914

DEVICE

UNDER

TEST

CL Includes Jig

Capacitance

RL = 3.3 kΩ

OUT

CL

Fig. 10 Transient Equivalent Testing

Load Circuit

LH28F800BG-L/BGH-L (FOR TSOP, CSP)

Test Configuration Capacitance Loading Value

TEST CONFIGURATION

CL (pF)

VCC = 3.3±0.3 V, 2.7 to 3.6 V

50

VCC = 5.0±0.25 V (NOTE 1)

30

VCC = 5.0±0.5 V

100

NOTE :

1. Applied to high-speed products, LH28F800BG-L85 and

LH28F800BGH-L85.

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