STM32F103VB 데이터 시트보기 (PDF) - STMicroelectronics

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STM32F103VB

Performance line, ARM-based 32-bit MCU with Flash, USB, CAN, seven 16-bit timers, two ADCs and nine communication interfaces

STMicroelectronics 

STM32F103xx

Electrical characteristics

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application is

executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE J

1752/3 standard which specifies the test board and the pin loading.

Table 26. EMI characteristics

Symbol Parameter

Conditions

Monitored

Frequency Band

Max vs. [fHSE/fHCLK]

8/48 MHz 8/72 MHz

Unit

0.1 to 30 MHz

12

SEMI

Peak level

VDD = 3.3 V, TA = 2 5 °C,

LQFP100 package

compliant with SAE J

30 to 130 MHz

130 MHz to 1GHz

22

23

1752/3

SAE EMI Level

4

12

19 dBµV

29

4

-

41/67

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