STM32F030C8P6TR(2013) 데이터 시트보기 (PDF) - STMicroelectronics

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STM32F030C8P6TR
(Rev.:2013)

Value-line ARM®-based 32-bit MCU with up to 256-KB Flash, timers, ADC, communication interfaces, 2.4-3.6 V operation

STMicroelectronics 

STM32F030x4 STM32F030x6 STM32F030x8

Electrical characteristics

6.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (more

than 5 LSB TUE), out of conventional limits of current injection on adjacent pins (more than

–5 µA) or other functional failure (reset occurrence or oscillator frequency deviation, for

example).

The characterization results are given in Table 43.

Symbol

IINJ

Table 43. I/O current injection susceptibility

Description

Functional

susceptibility

Unit

Negative Positive

injection injection

Injected current on BOOT0

–0

Injected current on all FT and FTf pins with induced

leakage current on adjacent pins less than –5 µA

–5

Injected current on all TTa pins with induced leakage

current on adjacent pins less than –5 µA

–5

Injected current on all TC and RESET pins with induced

leakage current on adjacent pins less than –5 µA

–5

NA

NA

mA

+5

+5

6.3.14 I/O port characteristics

General input/output characteristics

Unless otherwise specified, the parameters given in Table 44 are derived from tests

performed under the conditions summarized in Table 18: General operating conditions. All

I/Os are designed as CMOS and TTL compliant.

Table 44. I/O static characteristics

Symbol Parameter

Conditions

Min

Typ

TC and TTa I/O

-

-

VIL

Low level input

voltage

FT and FTf I/O

BOOT0

-

-

-

-

All I/Os except BOOT0 pin

-

-

Max

0.3 VDD+0.07(1)

0.475 VDD–0.2(1)

0.3 VDD–0.3(1)

0.3 VDD

Unit

V

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