
STMicroelectronics
INTRODUCTION
The ST72321Mx Flash devices are members of the ST7 microcontroller family designed for midrange applications.
All devices are based on a common industry standard 8-bit core, featuring an enhanced instruction set and are available with Flash memory.
FEATUREs
■ Memories
– 32 Kbytes to 60 Kbytes dual voltage High Density Flash (HDFlash) with read-out protection capability. In-application programming and In-circuit programming.
– 1 Kbyte to 2 Kbytes RAM
– HDFlash endurance: 100 cycles at 85 °C; data retention: 40 years at 85 °C
■ Clock, reset and supply management
– Enhanced low voltage supervisor (LVD) for main supply and auxiliary voltage detector (AVD) with interrupt capability
– Clock sources: crystal/ceramic resonator oscillators, internal RC oscillator and bypass for external clock
– PLL for 2x frequency multiplication
– Four power saving modes: Halt, Active-Halt, Wait and Slow
■ Interrupt management
– Nested interrupt controller
– 14 interrupt vectors plus TRAP and RESET
– Top Level Interrupt (TLI) pin
– 15 external interrupt lines (on 4 vectors)
■ Up to 64 I/O ports
– 64 multifunctional bidirectional I/O lines
– 34 alternate function lines
– 16 high sink outputs
■ 5 timers
– Main clock controller with: Real-time base, Beep and Clock-out capabilities
– Configurable watchdog timer
– Two 16-bit timers with: 2 input captures, 2 output compares, external clock input on one timer, PWM and pulse generator modes
– 8-bit PWM Auto-Reload timer with: 2 input captures, 4 PWM outputs, output compare and time base interrupt, external clock with event detector
■ 4 Communication interfaces
– SPI synchronous serial interface
– SCI asynchronous serial interface
– I2C multimaster interface (SMbus V1.1 compliant)
■ Analog periperal (low current coupling)
– 10-bit ADC with 16 input robust input ports
■ Instruction set
– 8-bit data manipulation
– 63 basic Instructions
– 17 main addressing modes
– 8 x 8 unsigned multiply instruction
■ Development tools
– Full hardware/software development package
– In-circuit testing capability