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C8051F521-C-IM View Datasheet(PDF) - Silicon Laboratories

Part Name
Description
MFG CO.
C8051F521-C-IM
Silabs
Silicon Laboratories 
C8051F521-C-IM Datasheet PDF : 221 Pages
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C8051F52x/F53x
Table 2.3. ADC0 Electrical Characteristics
VDD = 2.1 V, VREF = 1.5 V (REFSL=0), –40 to +125 °C unless otherwise specified.
Parameter
Conditions
Min Typ Max Units
DC Accuracy
Resolution
12
bits
Integral Nonlinearity
±3
LSB
Differential Nonlinearity
Offset Error1
Guaranteed Monotonic
±1
LSB
–10 ±1
+10
LSB
Full Scale Error
–20 ±1
+20
LSB
Dynamic Performance (10 kHz sine-wave Single-ended input, 0 to 1 dB below Full Scale, 200 ksps)
Signal-to-Noise Plus Distortion
Total Harmonic Distortion
Up to the 5th harmonic
60
66
dB
74
dB
Spurious-Free Dynamic Range
88
dB
Conversion Rate
SAR Conversion Clock
Burst Mode Oscillator
Conversion Time in SAR Clocks2
Track/Hold Acquisition Time3,6
Throughput Rate4
3
MHz
27
MHz
13
clocks
1
µs
200
ksps
Analog Inputs
ADC Input Voltage Range5
Absolute Pin Voltage wrt to GND
Sampling Capacitance
Input Multiplexer Impedance
gain = 1.0 (default)
gain = n
0
VREF
V
0
— VREF / n
0
VREGIN
V
24
pF
1.5
k
Power Specifications
Power Supply Current (from VDD)
Burst Mode (Idle)
Power-on Time
Power Supply Rejection
Operating Mode, 200 ksps
— 1050 1400
µA
— 930
µA
5
µs
1
mV/V
Notes:
1. Represents one standard deviation from the mean. Offset and full-scale error can be removed through
calibration.
2. An additional 2 FCLK cycles are required to start and complete a conversion.
3. Additional tracking time may be required depending on the output impedance connected to the ADC input.
See Section “4.3.6. Settling Time Requirements” on page 60.
4. An increase in tracking time will decrease the ADC throughput.
5. See Section “4.4. Selectable Gain” on page 60 for more information about setting the gain.
6. Additional tracking time might be needed ifVDD < 2.0 V; See Section “11.2.1. VDD Monitor Thresholds and
Minimum VDD” on page 108 for minimum VDD requirements.
28
Rev. 1.4

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