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SST39VF1602C-70-4C-MAKE View Datasheet(PDF) - Silicon Storage Technology

Part Name
Description
MFG CO.
SST39VF1602C-70-4C-MAKE
SST
Silicon Storage Technology 
SST39VF1602C-70-4C-MAKE Datasheet PDF : 39 Pages
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A Microchip Technology Company
16 Mbit Multi-Purpose Flash Plus
SST39VF1601C / SST39VF1602C
Data Sheet
Table 14:Recommended System Power-up Timings
Symbol
Parameter
Minimum
Units
TPU-READ1
Power-up to Read Operation
100
µs
TPU-WRITE1
Power-up to Program/Erase Operation
100
µs
T14.0 25018
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Table 15:Capacitance (TA = 25°C, f=1 Mhz, other pins open)
Parameter Description
Test Condition Maximum
CI/O1
CIN1
I/O Pin Capacitance
Input Capacitance
VI/O = 0V
VIN = 0V
12 pF
6 pF
T15.0 25018
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Table 16:Reliability Characteristics
Symbol
Parameter
Minimum Specification Units
Test Method
NEND1,2
Endurance
10,000
Cycles JEDEC Standard A117
TDR1
Data Retention
100
Years JEDEC Standard A103
ILTH1
Latch Up
100 + IDD
mA
JEDEC Standard 78
T16.2 25018
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
2. NEND endurance rating is qualified as a 10,000 cycle minimum for the whole device. A sector- or block-level rating would
result in a higher minimum specification.
©2011 Silicon Storage Technology, Inc.
19
DS-25018A
05/11

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