PC48F2000P0VBQ0 View Datasheet(PDF) - Intel

Part Name

Description

MFG CO.

PC48F2000P0VBQ0

Intel StrataFlash® Embedded Memory

Intel 

7.0

AC Characteristics

1-Gbit P30 Family

7.1

AC Test Conditions

Figure 13.

Figure 14.

AC Input/Output Reference Waveform

VCCQ

Input VCCQ/2

Test Points

VCCQ/2 Output

0V

Note: AC test inputs are driven at VCCQ for Logic "1" and 0.0 V for Logic "0." Input/output timing begins/ends

at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns. Worst case speed occurs at VCC = VCCMin.

Transient Equivalent Testing Load Circuit

Device

Under Test

Out

CL

.

Table 14.

NOTES:

1.

See the following table for component values.

2.

Test configuration component value for worst case speed conditions.

3.

CL includes jig capacitance

Test configuration component value for worst case speed conditions

Test Configuration

VCCQMin Standard Test

CL (pF)

30

Figure 15. Clock Input AC Waveform

VIH

CLK [C]

VIL

R202

R201

R203

Datasheet

Intel StrataFlash® Embedded Memory (P30)

Order Number: 306666, Revision: 001

April 2005

33

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