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SI5326C-C-GM View Datasheet(PDF) - Silicon Laboratories

Part Name
Description
MFG CO.
SI5326C-C-GM Datasheet PDF : 72 Pages
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Si5326
Table 4. AC Specifications (Continued)
(VDD = 1.8 ± 5%, 2.5 ±10%, or 3.3 V ±10%, TA = –40 to 85 °C)
Parameter
Output Rise/Fall
(20–80%) @
212.5 MHz output
Output Duty Cycle
Uncertainty @
622.08 MHz
Symbol
Test Condition
Min
CKOTRF
CMOS Output
VDD = 2.97
CLOAD = 5 pF
CKODC
100 Load
Line-to-Line
Measured at 50% Point
(Not for CMOS)
LVCMOS Input Pins
Minimum Reset Pulse tRSTMN
1
Width
Reset to Microproces-
sor Access Ready
tREADY
Input Capacitance
Cin
LVCMOS Output Pins
Rise/Fall Times
tRF
CLOAD = 20pf
See Figure 2
LOSn Trigger Window LOSTRIG From last CKINn to
Internal detection of LOSn
N3 1
Time to Clear LOL
after LOS Cleared
tCLRLOL
LOS to LOL
Fold = Fnew
Stable Xa/XB reference
Device Skew
Output Clock Skew
tSKEW
of CKOUTn to of
CKOUT_m, CKOUTn
and CKOUT_m at same
frequency and signal
format
PHASEOFFSET = 0
CKOUT_ALWAYS_ON = 1
SQ_ICAL = 1
Phase Change due to
tTEMP
Max phase changes from
Temperature Variation
–40 to +85 °C
Typ
Max
Unit
2
ns
+/-40
ps
µs
10
ms
3
pF
25
ns
4.5 x N3
TCKIN
10
ms
100
ps
300
500
ps
12
Rev. 1.0

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