SST29LE512-70-4C-PH View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
MFG CO.
SST29LE512-70-4C-PH Datasheet PDF : 26 Pages
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512 Kbit Page-Mode EEPROM
SST29EE512 / SST29LE512 / SST29VE512
Data Sheet
VIHT
VILT
INPUT
VHT
VLT
REFERENCE POINTS
VHT
VLT
OUTPUT
301 ILL F12.1
AC test inputs are driven at VIHT (2.4V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for
inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% ↔ 90%) are <10 ns.
FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS
Note: VHT - VHIGH Test
VLT - VLOW Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
TO DUT
TEST LOAD EXAMPLE
TO TESTER
CL
RL LOW
VDD
RL HIGH
FIGURE 14: A TEST LOAD EXAMPLE
301 ILL F13.1
©2001 Silicon Storage Technology, Inc.
17
S71060-06-000 6/01 301
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