CS1880-IB View Datasheet(PDF) - Cirrus Logic
Part Name
Description
MFG CO.
CS1880-IB Datasheet PDF : 70 Pages
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CS61880
TDI
TCK
TMS
Digital output pins
Digital input pins
parallel latched
output
JTAG BLOCK
Boundary Scan Data Register
Device ID Data Register
Bypass Data Register
Instruction (shift) Register
parallel latched output
TAP
Controller
MUX
Figure 14. Test Access Port Architecture
TDO
16.1 TAP Controller
The TAP Controller is a 16 state synchronous state
machine clocked by the rising edge of TCK. The
TMS input governs state transitions as shown in
Figure 15. The value shown next to each state tran-
sition in the diagram is the value that must be on
TMS when it is sampled by the rising edge of TCK.
16.1.1 JTAG Reset
TRST resets all JTAG circuitry.
16.1.2 Test-Logic-Reset
The test-logic-reset state is used to disable the test
logic when the part is in normal mode of operation.
This state is entered by asynchronously asserting
TRST or forcing TMS High for 5 TCK periods.
16.1.3 Run-Test-Idle
The run-test-idle state is used to run tests.
16.1.4 Select-DR-Scan
This is a temporary controller state.
16.1.5 Capture-DR
In this state, the Boundary Scan Register captures
input pin data if the current instruction is EXTEST
or SAMPLE/PRELOAD.
16.1.6 Shift-DR
In this controller state, the active test data register
connected between TDI and TDO, as determined
by the current instruction, shifts data out on TDO
on each rising edge of TCK.
16.1.7 Exit1-DR
This is a temporary state. The test data register se-
lected by the current instruction retains its previous
value.
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DS450PP2
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