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CS5376-BS 查看數據表(PDF) - Cirrus Logic

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CS5376-BS Datasheet PDF : 122 Pages
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CS5376
Test Bit Stream Generator
TBSCLK - Test Signal Modulator Clock Output, pin 8
A dedicated clock output pin to interface with an external ∆−Σ test DAC.
TBSDATA - Test Signal Modulator Data Output, pin 9
A dedicated data output pin to interface with an external ∆−Σ test DAC.
GPIO
GPIO[11:0] - General Purpose Input/Output, pins 32 to 37, 41 to 46
General purpose pins for controlling local peripherals. Also used as chip selects for the SPI
ports.
JTAG / IEEE-1149.1 Test Access Port
TRST - Test Reset, pin 1
JTAG reset input pin, resets the test access port controller (TAP).
TMS - Test Mode Select, pin 2
JTAG mode select input pin, control signal to the test access port controller (TAP).
TCK - Test Clock, pin 3
JTAG clock input pin, clocks the test access port controller (TAP).
TDI - Test Data Input, pin 4
JTAG data input pin, the path by which serial data enters the device.
TDO - Test Data Output, pin 5
JTAG data output pin, the path by which serial data exits the device.
DS256PP1
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