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STM32F103VB 查看數據表(PDF) - STMicroelectronics

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STM32F103VB Datasheet PDF : 67 Pages
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STM32F103xx
Electrical characteristics
5.3.5
Supply current characteristics
The current consumption is measured as described in Figure 10: Current consumption
measurement scheme.
Maximum current consumption
The MCU is placed under the following conditions:
All I/O pins are in input mode with a static value at VDD or VSS (no load)
All peripherals are disabled except if it is explicitly mentioned
The Flash access time is adjusted to fHCLK frequency (0 wait state from 0 to 24 MHz, 1
wait state from 24 to 48 MHz and 2 wait states above)
The parameters given in Table 11 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 7.
Table 11. Maximum current consumption in Run and Sleep modes(1)
Max(3)
Symbol Parameter
Conditions
FHCLK Typ(2) TA =
TA= Unit
85 °C 105 °C
External clock with PLL, code running from
Flash, all peripherals enabled (see RCC
register description):
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
72 MHz 36
48 MHz 30
36 MHz 22
24 MHz 21
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
External clock, PLL stopped, code running
from Flash, all peripherals enabled (see RCC
register description):
8 MHz
10
Supply
current in
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
Run mode External clock with PLL, code running from
72 MHz 32
RAM, all peripherals enabled (see RCC
48 MHz 22
TBD
45
31
TBD
mA
47
33
register description):
36 MHz 13
18
20
IDD
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
24 MHz 11
15
17
External clock, PLL stopped, code running
from RAM, all peripherals enabled (see RCC
register description):
8 MHz
4.5
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
TBD
TBD
Supply
current in
Sleep mode
External clock with PLL, code running from
RAM or Flash, all peripherals enabled (see
RCC register description):
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
External clock, PLL stopped, code running
from RAM or Flash, all peripherals enabled
(see RCC register description):
fPCLK1= fHCLK/2, fPCLK2 = fHCLK
72 MHz 22
35
48 MHz 14
23
36 MHz 13
22
24 MHz 10
17
37
25
24
19 mA
8 MHz 3.5 TBD TBD
1. TBD stands for to be determined.
2. Typical values are measured at TA = 25 °C, and VDD = 3.3 V
3. Data based on characterization results, tested in production at VDmax, fHCLK max. TAmax, and code executed from RAM.
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