STM8AP6266TC 查看數據表（PDF） - STMicroelectronics
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STM8AP6266TC
STMicroelectronics
STM8AP6266TC Datasheet PDF : 89 Pages
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Electrical characteristics
STM8AF61xx, STM8AF62xx
Table 43. ADC accuracy for VDDA = 5 V
Symbol
Parameter
Conditions
Typ
Max(1) Unit
|ET|
Total unadjusted error(2)
|EO|
Offset error(2)
|EG|
Gain error(2)
fADC = 2 MHz
|ED|
Differential linearity error(2)
|EL|
Integral linearity error(2)
|ET|
Total unadjusted error(2)
|EO|
Offset error(2)
|EG|
Gain error(2)
fADC = 4 MHz
|ED|
Differential linearity error(2)
|EL|
Integral linearity error(2)
1.4
0.8
0.1
0.9
0.7
1.9(4)
1.3(4)
0.6(4)
1.5(4)
1.2(4)
3(3)
3
2
1
1.5
4(4)
4(4)
3(4)
2(4)
1.5(4)
LSB
1. Max value is based on characterization, not tested in production.
2. ADC accuracy vs. injection current: Any positive or negative injection current within the limits specified for
IINJ(PIN) and ΣIINJ(PIN) in Section 10.3.6 does not affect the ADC accuracy.
3. TUE 2LSB can be reached on specific salestypes on the whole temperature range.
4. Target values.
Figure 41. ADC accuracy characteristics
1023
1022
1021
7
6
5
4
3
2
1
1LSBIDEAL
=
-V----D-----D----A------–----V-----S----S-----A--
1024
(2)
ET
EG
(3)
(1)
EO
EL
ED
1 LSBIDEAL
0 1234567
VSSA
1021102210231024
VDDA
1. Example of an actual transfer curve
2. The ideal transfer curve
3. End point correlation line
ET = Total unadjusted error: Maximum deviation between the actual and the ideal transfer curves.
EO = Offset error: Deviation between the first actual transition and the first ideal one.
EG = Gain error: Deviation between the last ideal transition and the last actual one.
ED = Differential linearity error: Maximum deviation between actual steps and the ideal one.
EL = Integral linearity error: Maximum deviation between any actual transition and the end point correlation
line.
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Doc ID 14952 Rev 6
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