DB2-074P(700) 查看數據表（PDF） - Amphenol Aerospace
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DB2-074P(700) Datasheet PDF : 44 Pages
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Low Mating Force Connector Accessories
test probe kit
In order to insure that contacts are properly wired
within a connector, a Test Probe Kit is needed (Part
number to order is 11-10400-22). This kit is espe-
cially designed to prevent damage to brush contacts
during probing. It cons ists of a plastic holder, insert,
and two contacts, usable for either Mother Board or
Daughter Board applications. It is recommended
that the user buy two kits, if using connectors of two
genders. The kits are not convertible after assem-
bly.
Instructions:
DB-IO Test Probe -
Slide the insert back over the
wire and crimp contact on.
Follow crimping proced ure
below. Then snap the insert
and contact assembly into
the holder.
MB-PC Test probe -
Slide holder over wire and
then crimp contact. Follow
crimping procedure below.
Slide the insert on the
contact and seat it against
the shoulder. Slide the
holder forward and snap it
onto the insert.
Crimping Procedure: Using accepted industry
procedures, strip wire end to be terminated 1/8 to
5/32 inch. Care should be taken not to nick wire
strands. Assemble the M22520/2-01 crimp tool and
the M22520/2-27 positioner, and place tool selector
in correct setting for wire size. Selected wire size
must not have an insulation diameter more
than .062 for MB-PC and not more than .038 for
DB/IO.
AWG 22
24
26
28
SEL 5
4
3
2
Insert stripped wire end into contact wire well.
Strands should be visible in wire well inspection
hole. Bottom contact and wire assembly in posi
tioner, and close handles of crimp tool to complete
crimp. Handles will not open unless full crimping
cycle has been completed.
.18
.675 MAX.
±.03
.072
±.025
.038
DIA. MIN.
.125
DIA. MAX.
DAUGHTER BOARD - INPUT/OUTPUT TEST PROBE
.675 MAX.
.18
±.03
.113 – .146
.062
DIA. MIN.
.110
DIA. MAX.
MOTHER BOARD - PC TEST PROBE
25
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