CS5467
8.4 Page 2 Registers
8.4.1 Voltage Sag and Current Fault Duration (V1SagDUR , V2SagDUR , I1FaultDUR , I2FaultDUR )
Address: 0 (V1SagDUR ), 8 (V2SagDUR ), 4 (I1FaultDUR ), 12 (I2FaultDUR )
MSB
LSB
0
222 221 220 219 218 217 216 .....
26
25
24
23
22
21
20
Default = 0
Voltage sag duration, V1SagDUR (V2SagDUR) and current fault duration, I1FaultDUR (I2FaultDUR) determine
the count of output word rate (OWR) samples utilized to determine a sag or fault event. These are integers in
the range of 0 to 8,388,607 samples. A value of zero disables the feature.
8.4.2 Voltage Sag and Current Fault Level (V1SagLEVEL , V2SagLEVEL , I1FaultLEVEL , I2FaultLEVEL )
Address: 1 (V1SagLEVEL ), 9 (V2SagLEVEL ), 5 (I1FaultLEVEL ), 13 (I2FaultLEVEL )
MSB
LSB
-(20) 2-1
2-2
2-3
2-4
2-5
2-6
2-7
..... 2-17 2-18 2-19 2-20 2-21 2-22 2-23
Default = 0
Voltage sag level, V1SagLEVEL (V2SagLEVEL ) and current fault level, I1FaultLEVEL (I2FaultLEVEL ) establish
an input level below which a sag or fault is triggered. These are two's complement values in the range of
-1.0 ≤ value < 1.0, with the binary point to the right of the MSB. Negative values are not used.
8.5 Page 5 Register
8.5.1 Temperature Measurement (TMEAS ) – Address: 26
MSB
LSB
223 222 221 220 219 218 217 216 .....
26
25
24
23
22
21
20
Default = 0
The Temperature Measurement (TMEAS) register is used to cycle-steal voltage channel2 for temperature
measurement. Writing a one to the LSB causes the temperature to be measured and the Temperature register
(T) to be updated.
Refer to 6.13 Temperature Measurement on page 22 for more information.
DS714F1
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