C8051F38C-GMR 查看數據表（PDF） - Silicon Laboratories

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C8051F38C-GMR

Full Speed USB Flash MCU Family

Silicon Laboratories 

C8051F380/1/2/3/4/5/6/7/C

Table 5.3. Port I/O DC Electrical Characteristics

VDD = 2.7 to 3.6 V, –40 to +85 °C unless otherwise specified.

Parameter

Test Condition

Min

Typ

Max

Output High Voltage IOH = –3 mA, Port I/O push-pull VDD – 0.7

—

—

IOH = –10 µA, Port I/O push-pull VDD – 0.1

—

—

IOH = –10 mA, Port I/O push-pull

—

VDD – 0.8

—

Output Low Voltage

IOL = 8.5 mA

IOL = 10 µA

IOL = 25 mA

—

—

0.6

—

—

0.1

—

1.0

—

Input High Voltage

2.0

—

—

Input Low Voltage

—

—

0.8

Input Leakage

Current

Weak Pullup Off

Weak Pullup On, VIN = 0 V

—

—

±1

—

15

50

Unit

V

V

V

V

µA

Table 5.4. Reset Electrical Characteristics

–40 to +85 °C unless otherwise specified.

Parameter

Test Condition

Min

Typ

Max

Unit

RST Output Low Voltage

RST Input High Voltage

RST Input Low Voltage

RST Input Pullup Current

IOL = 8.5 mA,

VDD = 2.7 V to 3.6 V

RST = 0.0 V

—

—

0.6

V

0.7 x VDD —

—

V

—

— 0.3 x VDD V

—

15

40

µA

VDD Monitor Threshold (VRST)

2.60

2.65

2.70

V

Missing Clock Detector Time- Time from last system clock

80

580

800

µs

out

rising edge to reset initiation

Reset Time Delay

Delay between release of any

—

reset source and code

execution at location 0x0000

—

250

µs

Minimum RST Low Time to

Generate a System Reset

15

—

—

µs

VDD Monitor Turn-on Time

VDD Monitor Supply Current

—

—

100

µs

—

15

50

µA

Rev. 1.4

39

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