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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

ST72F324J2TCX 데이터 시트보기 (PDF) - STMicroelectronics

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ST72F324J2TCX Datasheet PDF : 194 Pages
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Electrical characteristics
ST72324xx-Auto
Table 100. EMS test results
Symbol
Parameter
Conditions
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
8 or 16 Kbyte Flash device:
VDD = 5V, TA = +25°C, fOSC = 8 MHz
conforms to IEC 1000-4-2
VFFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VDD pins
to induce a functional disturbance
VDD = 5V, TA = +25°C, fOSC = 8 MHz
conforms to IEC 1000-4-4
Level/class
4B
4A
12.8.2 Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling two LEDs through the I/O
) ports), the product is monitored in terms of emission. This emission test is in line with the
t(s norm SAE J 1752/3 which specifies the board and the loading of each pin.
uc Table 101. EMI emissions
Prod Symbol Parameter Conditions
Device/package(1)
Monitored
frequency band
Max vs [fOSC/fCPU]
Unit
8/4 MHz 16/8 MHz
olete 8/16 Kbyte Flash
s LQFP44
uct(s) - Ob SEMI
VDD = 5V
Peak level(2)
TA = +25°C
conforming to
SAE J 1752/3
32 Kbyte Flash
LQFP44
Prod 32 Kbyte Flash
olete LQFP32
0.1 MHz to 30 MHz
12
30 MHz to 130 MHz 19
130 MHz to 1 GHz
15
SAE EMI Level
3
0.1 MHz to 30 MHz
20
30 MHz to 130 MHz 26
130 MHz to 1 GHz
22
SAE EMI Level
3.5
0.1 MHz to 30 MHz
25
30 MHz to 130 MHz 30
130 MHz to 1 GHz
18
SAE EMI Level
3.0
18
25 dBµV
22
3.5
-
21
31 dBµV
28
4.0
-
27
36 dBµV
23
3.5
-
bs 1. Refer to application note AN1709 for data on other package types.
O2. Data based on characterization results, not tested in production.
12.8.3
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
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Doc ID 13841 Rev 1

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