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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

74LVQ157T 데이터 시트보기 (PDF) - STMicroelectronics

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74LVQ157T
ST-Microelectronics
STMicroelectronics 
74LVQ157T Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
74LVQ157
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = tf =3 ns)
Symb ol
Parameter
T est Con ditio n
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
tPLH Propagation Delay Time
tPHL (SELECT-Y)
2.7
3.3(*)
7.5 15
6.5 11
17
ns
12
tPLH Propagation Delay Time
tPHL (STROBE-Y)
2.7
3.3(*)
7
15
6
11
17
ns
12
tPLH Propagation Delay Time
tPHL (A,B-Y)
2.7
3.3(*)
6
11
5
8
13
ns
9
tOSLH Output to Output Skew
tOSHL Time (note 1, 2)
2.7
3.3(*)
0.5 1.5
0.5 1.5
1.5 ns
1.5
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any twooutputs of the same device switching in the
same direction, either HIGH or LOW (tOSLH = |tPLHm - tPLHn|, tOSHL = |tPHLm - tpHLn|)
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS
Symb ol
Parameter
Test Conditions
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
CIN Input Capacitance
3.3
5
pF
CPD Power Dissipation
3.3
fIN = 10 MHz
24
pF
Capacitance (note 1)
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD VCC fIN + ICC/4(per channel)
TEST CIRCUIT
CL = 50 pF or equivalent (includes jigand probe capacitance)
RL = R1 = 500orequivalent
RT = ZOUT of pulse generator (typically 50)
4/8

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