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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

STM32F405ZET7 데이터 시트보기 (PDF) - STMicroelectronics

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STM32F405ZET7 Datasheet PDF : 185 Pages
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Electrical characteristics
STM32F405xx, STM32F407xx
5.3.8
External clock source characteristics
High-speed external user clock generated from an external source
The characteristics given in Table 29 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 14.
Table 29. High-speed external user clock characteristics
Symbol
Parameter
Conditions
Min Typ Max Unit
fHSE_ext
External user clock source
frequency(1)
1
-
50 MHz
VHSEH
VHSEL
OSC_IN input pin high level voltage
OSC_IN input pin low level voltage
0.7VDD -
VDD
V
VSS
- 0.3VDD
tw(HSE)
tw(HSE)
tr(HSE)
tf(HSE)
Cin(HSE)
OSC_IN high or low time(1)
OSC_IN rise or fall time(1)
OSC_IN input capacitance(1)
5
-
-
ns
-
-
10
-
5
-
pF
DuCy(HSE) Duty cycle
45
-
55
%
IL
OSC_IN Input leakage current
VSS VIN VDD
-
-
±1
µA
1. Guaranteed by design, not tested in production.
Low-speed external user clock generated from an external source
The characteristics given in Table 30 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 14.
Symbol
Table 30. Low-speed external user clock characteristics
Parameter
Conditions
Min
Typ
fLSE_ext
User External clock source
frequency(1)
VLSEH
OSC32_IN input pin high level
voltage
VLSEL OSC32_IN input pin low level voltage
tw(LSE)
tf(LSE)
OSC32_IN high or low time(1)
tr(LSE)
tf(LSE)
Cin(LSE)
OSC32_IN rise or fall time(1)
OSC32_IN input capacitance(1)
DuCy(LSE) Duty cycle
IL
OSC32_IN Input leakage current
1. Guaranteed by design, not tested in production.
VSS VIN VDD
-
32.768
0.7VDD
-
VSS
-
450
-
-
-
-
5
30
-
-
-
Max
1000
VDD
0.3VDD
-
50
-
70
±1
Unit
kHz
V
ns
pF
%
µA
96/185
DocID022152 Rev 4

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