datasheetbank_Logo
データシート検索エンジンとフリーデータシート

CS5376-BS データシートの表示(PDF) - Cirrus Logic

部品番号
コンポーネント説明
メーカー
CS5376-BS Datasheet PDF : 122 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
CS5376
controller to SPI 1 connection during the initial EE-
PROM boot. After the initial configuration is
loaded, the microcontroller seizes control of the
SPI 1 port and updates the configuration as re-
quired. The EEPROM will not interfere with mi-
crocontroller to SPI 1 transactions provided the
initial stand-alone boot was completed.
Updated configuration information from the micro-
controller can not be written until the EEPROM
boot loader has relinquished control of the SPI 1
port. To guarantee this, the microcontroller should
monitor the CS5376 CS11 / GPIO11 pin into the
EEPROM for inactivity, or simply wait the maxi-
mum time required to boot from EEPROM. The re-
quired boot time from EEPROM depends on the
number of coefficients written, the number of reg-
isters written, and if test bit stream data is written.
A final requirement for hybrid boot mode is the
ability to address both the CS5376 and the config-
uration EEPROM. When writing to the CS5376
SPI 1 port, serial transactions use an 8-bit address.
Supported serial EEPROMs, however, require seri-
al transactions to use 16-bit addressing. If a micro-
controller is to interface with the CS5376 and also
be able to in-circuit reprogram the configuration
EEPROM, the serial port connection must support
both addressing modes.
See Serial Peripheral Interface 1on page 21 for
information about connections to the SPI 1 port,
the format required for EEPROM data, and the
SPI 1 commands available for updating the config-
uration.
4.3 Reset Self-Tests
After the reset signal is de-asserted but before the
CS5376 starts the boot operation, a series of self
test are run. These tests check the operation of the
decimation engine and report pass/fail codes in the
SELFTEST register (0x2F). The full suite of self
tests require approximately 60ms to complete.
Program ROM Test
This self-test calculates a checksum from the con-
tents of program ROM and compares against an ex-
pected value. The result of this test is 0x00000A if
passed or 0x00000F if failed.
Data ROM Test
This self-test calculates a checksum from the con-
tents of data ROM and compares against an expect-
ed value. The result of this test is 0x0000A0 if
passed or 0x0000F0 if failed.
Program RAM Test
This self-test writes a series of patterns into the pro-
gram RAM and compares against expected read
values. The result of this test is 0x000A00 if passed
or 0x000F00 if failed.
Data RAM Test
This self-test writes a series of patterns into the data
RAM and compares against expected read values.
The result of this test is 0x00A000 if passed or
0x00F000 if failed.
Execution Unit Test
This self-test exercises the execution unit with a se-
quence of calculations, comparing against expect-
ed values. The result of this test is 0x0A0000 if
passed or 0x0F0000 if failed.
DS256PP1
19

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]