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STM32L152CBH6DTR(2013) データシートの表示(PDF) - STMicroelectronics

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STM32L152CBH6DTR Datasheet PDF : 121 Pages
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STM32L151x6/8/B, STM32L152x6/8/B
Revision history
Table 70. Document revision history (continued)
Date
Revision
Changes
Modified 1st page (low power features)
Added STM32L15xC6 and STM32L15xR6 devices (32 Kbytes of Flash
memory).
Modified Section 3.6: GPIOs (general-purpose inputs/outputs) on
17-June-2011
5
page 22
Modified Section 6.3: Operating conditions on page 50
Modified Table 55: ADC accuracy on page 92, Table 57: DAC
characteristics on page 96 and Table 59: Comparator 1 characteristics
on page 99
25-Jan-2012
Features: updated internal multispeed low power RC.
Table 2: Ultra-low-power STM32L15xxx device features and peripheral
counts: LCD 4x44 and 8x40 available for both 64- and 128-Kbyte
devices; two comparators available for all devices.
Figure 8: STM32L15xCx UFQFPN48 pinout: replaced VFQPN48 by
UFQFPN48 as name of package.
Table 9: STM32L15xxx pin definitions: replaced PH0/PH1 by
PC14/PC15.
Table 10: Alternate function input/output: removed EVENT OUT from
PH2 port, AFIO15 column.
Table 13: Functionalities depending on the operating power supply
range: added footnote 1.
Table 19: Current consumption in Sleep mode: updated MSI conditions
and fHCLK.
Table 20: Current consumption in Low power run mode: updated some
temperature conditions; added footnote 2.
Table : : updated some temperature conditions and one of the MSI
clock conditions.
Table 22: Typical and maximum current consumptions in Stop mode:
6
updated IDD (WU from Stop) parameter.
Table 23: Typical and maximum current consumptions in Standby
mode: updated IDD (WU from Standby) parameter.
Table 24: Typical and maximum timings in Low power modes: updated
fHCLK value for tWUSLEEP_LP; updated typical value of parameter
“Wakeup from Stop mode, regulator in Run mode”.
Table 25: Peripheral current consumption: replaced GPIOF by GPIOH.
Table 33: PLL characteristics: updated “PLL output clock”
Table 35: Flash memory and data EEPROM characteristics: updated all
information for IDD.
Figure 18: I/O AC characteristics definition: replaced the falling edge
“tr(IO)out” by “tf(IO)out”.
Table 47: I2C characteristics: amended footnote 2.
Table 54: ADC characteristics: updated fS max value for direct
channels, 6-bit sampling rate.
Table 55: ADC accuracy: Updated the first, third and fourth fADC test
condition.
Table 58: Temperature sensor characteristics: updated typ, min, and
max values of the TS_temp parameter.
Doc ID 17659 Rev 8
119/121

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