LH28F160S5HD-L90 Ver la hoja de datos (PDF) - Sharp Electronics
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LH28F160S5HD-L90
Sharp Electronics
LH28F160S5HD-L90 Datasheet PDF : 55 Pages
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LH28F160S5-L/S5H-L
6.2.5 AC CHARACTERISTICS - WRITE OPERATIONS (NOTE 1)
[LH28F160S5-L]
• VCC = 5.0±0.25 V, 5.0±0.5 V, TA = 0 to+70°C
VERSIONS
VCC±0.25 V
(NOTE 5)
LH28F160S5-L70
VCC±0.5 V
(NOTE 6)
(NOTE 6)
UNIT
LH28F160S5-L70 LH28F160S5-L10
SYMBOL
PARAMETER
NOTE MIN.
tAVAV Write Cycle Time
70
RP# High Recovery to WE#
tPHWL
Going Low
2
1
tELWL CE# Setup to WE# Going Low
10
tWLWH WE# Pulse Width
40
WP# VIH Setup to WE#
tSHWH
Going High
2
100
tVPWH VPP Setup to WE# Going High
2
100
Address Setup to WE#
tAVWH
Going High
3
40
tDVWH Data Setup to WE# Going High 3
40
tWHDX Data Hold from WE# High
5
tWHAX Address Hold from WE# High
5
tWHEH CE# Hold from WE# High
10
tWHWL WE# Pulse Width High
30
tWHRL WE# High to STS Going Low
tWHGL Write Recovery before Read
0
tQVVL
VPP Hold from Valid SRD,
STS High Z
2, 4
0
tQVSL WP# VIH Hold from Valid SRD, 2, 4
0
STS High Z
NOTES :
1. Read timing characteristics during block erase, full chip
erase, (multi) word/byte write and block lock-bit
configuration operations are the same as during read-
only operations. Refer to Section 6.2.4 "AC
CHARACTERISTICS" for read-only operations.
2. Sampled, not 100% tested.
3. Refer to Table 3 for valid AIN and DIN for block erase,
full chip erase, (multi) word/byte write or block lock-bit
configuration.
4. VPP should be held at VPPH1 until determination of block
erase, full chip erase, (multi) word/byte write or block
lock-bit configuration success (SR.1/3/4/5 = 0).
MAX.
90
MIN.
80
1
10
40
100
100
40
40
5
5
10
30
0
0
MAX.
90
MIN.
100
1
10
40
100
100
40
40
5
5
10
30
0
0
MAX.
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
90 ns
ns
ns
0
0
ns
5. See Fig. 12 "Transient Input/Output Reference
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
6. See Fig. 13 "Transient Input/Output Reference
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
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