STM32F100R4H7BTR(2010) View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

STM32F100R4H7BTR
(Rev.:2010)

Low & medium-density value line, advanced ARM-based 32-bit MCU with 16 to 128 KB Flash, 12 timers, ADC, DAC & 8 comm interfaces

STMicroelectronics 

STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB

Electrical characteristics

Table 19. High-speed external user clock characteristics

Symbol

Parameter

Conditions

Min Typ Max Unit

fHSE_ext

User external clock source

frequency(1)

1

8

24 MHz

VHSEH

VHSEL

OSC_IN input pin high level voltage

OSC_IN input pin low level voltage

0.7VDD

VSS

VDD

V

0.3VDD

tw(HSE)

tw(HSE)

tr(HSE)

tf(HSE)

Cin(HSE)

OSC_IN high or low time(1)

OSC_IN rise or fall time(1)

OSC_IN input capacitance(1)

16

ns

20

5

pF

DuCy(HSE) Duty cycle

45

55

%

IL

OSC_IN Input leakage current

VSS  VIN  VDD

±1 µA

1. Guaranteed by design, not tested in production.

Low-speed external user clock generated from an external source

The characteristics given in Table 20 result from tests performed using an low-speed

external clock source, and under the ambient temperature and supply voltage conditions

summarized in Table 8.

Table 20. Low-speed external user clock characteristics

Symbol

Parameter

Conditions

Min Typ Max Unit

fLSE_ext

User external clock source

frequency(1)

32.768 1000 kHz

VLSEH

VLSEL

OSC32_IN input pin high level

voltage

OSC32_IN input pin low level

voltage

0.7VDD

VSS

VDD

V

0.3VDD

tw(LSE)

tw(LSE)

OSC32_IN high or low time(1)

450

tr(LSE)

tf(LSE)

OSC32_IN rise or fall time(1)

Cin(LSE) OSC32_IN input capacitance(1)

5

DuCy(LSE) Duty cycle

30

IL

OSC32_IN Input leakage current VSS  VIN  VDD

1. Guaranteed by design, not tested in production.

ns

50

pF

70

%

±1

µA

Doc ID 16455 Rev 2

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