STM32F030R4T6TR(2013) View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

STM32F030R4T6TR
(Rev.:2013)

Value-line ARM®-based 32-bit MCU with up to 256-KB Flash, timers, ADC, communication interfaces, 2.4-3.6 V operation

STMicroelectronics 

Electrical characteristics

STM32F030x4 STM32F030x6 STM32F030x8

Table 21. Embedded internal reference voltage (continued)

Symbol

Parameter

Conditions

Min Typ Max Unit

VREFINT

Internal reference voltage

spread over the temperature

range

VDDA = 3 V ±10 mV

-

- 10(3)

mV

TCoeff

Temperature coefficient

- - 100(3) ppm/°C

1. Data based on characterization results, not tested in production.

2. Shortest sampling time can be determined in the application by multiple iterations.

3. Guaranteed by design, not tested in production.

6.3.5

Supply current characteristics

The current consumption is a function of several parameters and factors such as the

operating voltage, ambient temperature, I/O pin loading, device software configuration,

operating frequencies, I/O pin switching rate, program location in memory and executed

binary code.

The current consumption is measured as described in Figure 11: Current consumption

measurement scheme.

All Run-mode current consumption measurements given in this section are performed with a

reduced code that gives a consumption equivalent to CoreMark code.

Typical and maximum current consumption

The MCU is placed under the following conditions:

 All I/O pins are in input mode with a static value at VDD or VSS (no load)

 All peripherals are disabled except when explicitly mentioned

 The Flash memory access time is adjusted to the fHCLK frequency (0 wait state from 0

to 24 MHz and 1 wait state above 24 MHz)

 Prefetch is ON when the peripherals are enabled, otherwise it is OFF (to enable

prefetch the PRFTBE bit in the FLASH_ACR register must be set before clock setting

and bus prescaling)

 When the peripherals are enabled fPCLK = fHCLK

The parameters given in Table 22 to are derived from tests performed under ambient

temperature and supply voltage conditions summarized in Table 18: General operating

conditions.

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