SST29LE010A-200-4C-PH View Datasheet(PDF) - Silicon Storage Technology

Part Name

Description

MFG CO.

SST29LE010A-200-4C-PH

1 Mbit (128K x8) Page-Mode EEPROM

Silicon Storage Technology 

1 Megabit Page Mode EEPROM

SST29EE010A / SST29LE010A / SST29VE010A

VIHT

VILT

INPUT

VHT

VLT

REFERENCE POINTS

VHT

VLT

OUTPUT

303 ILL F12.1

AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for

inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Inputs rise and fall times (10% ↔ 90%) are <10 ns.

Note: VHT–VHIGH Test

VLT–VLOW Test

VIHT–VINPUT HIGH Test

VILT–VINPUT LOW Test

FIGURE 11: AC INPUT/OUTPUT REFERENCE WAVEFORMS

TO DUT

TEST LOAD EXAMPLE

TO TESTER

CL

RL LOW

FIGURE 12: A TEST LOAD EXAMPLE

VCC

RL HIGH

303 ILL F13.0

© 1999 Silicon Storage Technology, Inc.

16

303-01 2/99

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