MX29F002/002N T/B
ERASE AND PROGRAMMING PERFORMANCE(1)
PARAMETER
MIN.
LIMITS
TYP.(2)
Sector Erase Time
Chip Erase Time
Byte Programming Time
Chip Programming Time
Erase/Program Cycles
1
3
7
3.5
100,000
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25° C, 5V.
3.Maximum values measured at 25° C, 4.5V.
MAX.(3)
8
24
210
10.5
UNITS
s
s
us
sec
Cycles
LATCH-UP CHARACTERISTICS
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
Current
Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time.
MIN.
-1.0V
-1.0V
-100mA
MAX.
13.5V
Vcc + 1.0V
+100mA
DATA RETENTION
PARAMETER
Data Retention Time
MIN.
20
UNIT
Years
P/N: PM0547
REV. 1.5, MAR. 28, 2005
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