MX29F002BQC-70 View Datasheet(PDF) - Macronix International

Part Name

Description

MFG CO.

MX29F002BQC-70

2M-BIT [256K x 8] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F002/002N T/B

1.6K ohm

+5V

CL

1.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance

CL=50pF for MX29F002T/B-55

SWITCHING TEST WAVEFORMS(I) for speed grade 70ns max.

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are equal to or less than 20ns.

SWITCHING TEST WAVEFORMS(II) for speed grade 55ns(MX29F002T/B-55)

3.0V

0V

1.5V

TEST POINTS

INPUT

1.5V

OUTPUT

AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".

Input pulse rise and fall times are < 5ns.

P/N: PM0547

REV. 1.5, MAR. 28, 2005

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