M58LW128B150N1T View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

M58LW128B150N1T

128 Mbit (8Mb x16 or 4Mb x32, Uniform Block, Burst) 3V Supply Flash Memories

STMicroelectronics 

M58LW128A, M58LW128B

MAXIMUM RATING

Stressing the device above the ratings listed in Ta-

ble 13, Absolute Maximum Ratings, may cause

permanent damage to the device. These are

stress ratings only and operation of the device at

these or any other conditions above those indicat-

ed in the Operating sections of this specification is

not implied. Exposure to Absolute Maximum Rat-

ing conditions for extended periods may affect de-

vice reliability. Refer also to the

STMicroelectronics SURE Program and other rel-

evant quality documents.

Table 13. Absolute Maximum Ratings

Symbol

Parameter

Min

TBIAS

Temperature Under Bias

–40

TSTG

Storage Temperature

–55

TLEAD

Maximum TLEAD Temperature during soldering

VIO

Input or Output Voltage

–0.6

VDD, VDDQ

Supply Voltage

–0.6

VHH

RP Hardware Block Unprotect Voltage

–0.6

Note: 1. Cumulative time at a high voltage level of 10V should not exceed 80 hours on RP pin.

Value

Max

125

150

t.b.a.

VDDQ +0.6

5.0

10 (1)

Unit

°C

°C

°C

V

V

V

32/65

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