datasheetbank_Logo    Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site
Part Number :
Home  >>>  NTE Datasheet

NTE

  

Datasheet PDF

Match, Like N/A
Start with NTE0* NTE1* NTE2* NTE3* NTE4* NTE5* NTE6* NTE7* NTE8* NTE9*
End *ANTE *DNTE *SNTE
Included *ANTE* *DNTE* *0NTE* *5NTE* *4NTE* *6NTE* *1NTE* *7NTE* *3NTE* *9NTE* *BNTE* *CNTE* *2NTE* *INTE* *JNTE* *GNTE* *uNTE* *ENTE*

View Details

Manufacturer Part no Description View
TI
Texas Instruments
SN74AS874NTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops feature 3-state outputs designed specifically as bus drivers. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

• 3-State Buffer-Type Outputs Drive Bus Lines Directly
• Bus-Structured Pinout
• Choice of True or Inverting Logic
   – SN54ALS874B, SN74ALS874B, SN74AS874 Have True Outputs
   – SN74ALS876A, SN74AS876 Have Inverting Outputs
• Asynchronous Clear
• Package Options Include Plastic Small-Outline (DW) Packages, Plastic (FN) and Ceramic (FK) Chip Carriers, and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

 


other parts : 84010013A  8401001KA  8401001LA  SN54ALS874B  SN54ALS874BFK  SN54ALS874BJT  SN74ALS874B  SN74ALS874BDW  SN74ALS874BDWE4  SN74ALS874BDWG4  
SN74AS874NTE4 PDF
TI
Texas Instruments
SN74BCT652NTE4 OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

description
These devices consist of bus transceiver circuits, D-type flip-flops, and control circuitry arranged for
 multiplexed transmission of data directly from the data bus or from the internal storage registers.

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ
ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
Independent Registers and Enables for A and B Buses
Multiplexed Real-Time and Stored Data
Power-Up High-Impedance Mode
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)


other parts : 5962-9155301MKA  BCT652  SN54BCT652  SN54BCT652FK  SN54BCT652JT  SN54BCT652W  SN74BCT652  SN74BCT652DW  SN74BCT652DWE4  SN74BCT652DWG4  
SN74BCT652NTE4 PDF
Vicor
Vicor
VI-2NTEX DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create synchronous
arrays capable of supplying several kilowatts of output power.

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT, AUSTEL
■Up to 90% Efficiency
■Size: 4.6" x 2.4" x 0.5" (116,8 x 61,0 x 12,7)
■Remote Sense and Current Limit
■OVP, Thermal Shutdown
■Logic Disable
■Wide Range Output Adjust
■Compatible Power Booster Modules
■ZCS Power Architecture
■Low Noise FM Control
■CE Marked


other parts : VI-200CU  VI-200CV  VI-200CW  VI-200CX  VI-200CY  VI-200EU  VI-200EV  VI-200EW  VI-200EX  VI-200EY  
VI-2NTEX PDF
TI
Texas Instruments
SN74BCT8374ANTE4 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPEtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Members of the Texas Instruments SCOPEFamily of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPEInstruction Set
  − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  − Parallel-Signature Analysis at Inputs
  − Pseudo-Random Pattern Generation From Outputs
  − Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs


other parts : 5962-9172701Q3A  5962-9172701QLA  BCT8374A  SN54BCT8374A  SN54BCT8374AFK  SN54BCT8374AJT  SN74BCT8374A  SN74BCT8374ADW  SN74BCT8374ADWE4  SN74BCT8374ADWG4  
SN74BCT8374ANTE4 PDF
Vicor
Vicor
VI-JNTEY MiniMod DC-DC Converters 25 to 100 Watts

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT
■CE Marked
■Up to 90% Efficiency
■Size: 2.28" x 2.4" x 0.5" (57,9 x 61,0 x 12,7)
■Remote Sense and Current Limit
■Logic Disable
■Wide Range Output Adjust
■ZCS Power Architecture
■Low Noise FM Control


other parts : VI-J00  VI-J00-CW  VI-J00-CW-F1  VI-J00-CW-F2  VI-J00-CW-S  VI-JT3-EW  VI-J00-CX  VI-J00-CX-F1  VI-J00-CX-F2  VI-J00-CX-S  
VI-JNTEY PDF
TI
Texas Instruments
SN74ALS874BNTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops feature 3-state outputs designed specifically as bus drivers. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

• 3-State Buffer-Type Outputs Drive Bus Lines Directly
• Bus-Structured Pinout
• Choice of True or Inverting Logic
   – SN54ALS874B, SN74ALS874B, SN74AS874 Have True Outputs
   – SN74ALS876A, SN74AS876 Have Inverting Outputs
• Asynchronous Clear
• Package Options Include Plastic Small-Outline (DW) Packages, Plastic (FN) and Ceramic (FK) Chip Carriers, and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

 


other parts : 84010013A  8401001KA  8401001LA  SN54ALS874B  SN54ALS874BFK  SN54ALS874BJT  SN74ALS874B  SN74ALS874BDW  SN74ALS874BDWE4  SN74ALS874BDWG4  
SN74ALS874BNTE4 PDF
TI
Texas Instruments
TMP422AMDCNTEP ±1°C REMOTE TEMPERATURE AND ±2.5°C LOCAL TEMPERATURE SENSOR IN SOT23-8

DESCRIPTION
The TMP422 is a remote temperature sensor monitor with a built-in local temperature sensor. The remote temperature sensor diode-connected transistors are typically low-cost, NPN- or PNP-type transistors or diodes that are an integral part of microcontrollers, microprocessors, or FPGAs.
Remote accuracy is ±1°C for multiple IC manufacturers, with no calibration needed. The two-wire serial interface accepts SMBus write byte, read byte, send byte, and receive byte commands to configure the device.

FEATURES
• SOT23-8 Package
• ±1°C Remote Diode Sensor (Max)
• ±2.5°C Local Temperature Sensor (Max)
• Series Resistance Cancellation
• n-Factor Correction
• Two-Wire/ SMBus™ Serial Interface
• Multiple Interface Addresses
• Diode Fault Detection
• RoHS Compliant and NO Sb/Br

APPLICATIONS
• Processor/FPGA Temperature Monitoring
• LCD/ DLP®/LCOS Projectors
• Servers
• Central Office Telecom Equipment
• Storage Area Networks (SAN)


other parts : TMP422-EP  V62/11618-01XE  
TMP422AMDCNTEP PDF
TI
Texas Instruments
SN74BCT543NTE4 OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS

description
The ′BCT543 octal transceiver contains two sets of D-type latches for temporary storage of data flowing in either direction. Separate latch-enable (LEAB or LEBA) and output-enable (OEAB or OEBA) inputs are provided for each register to permit independent control in either direction of data flow.
The A-to-B enable (CEAB) input must be low in order to enter data from A or to output data from B. If CEAB is low and LEAB is low, the A-to-B latches are transparent; a subsequent low-to-high transition of LEAB puts the A latches in the storage mode. With CEAB and OEAB both low, the 3-state B outputs are active and reflect the data present at the output of the A latches. Data flow from B to A is similar but requires using the CEBA, LEBA, and OEBA inputs.
The SN54BCT543 is characterized for operation over the full military temperature range of −55°C to 125°C. The SN74BCT543 is characterized for operation from 0°C to 70°C.

• State-of-the-Art BiCMOS Design Significantly Reduces ICCZ
• 3-State True Outputs
• Back-to-Back Registers for Storage
• ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015
• Package Options Include Plastic
   Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plastic and Ceramic 300-mil DIPs (JT, NT)

 


other parts : 5962-9087001M3A  5962-9087001MKA  5962-9087001MLA  SN54BCT543  SN54BCT543FK  SN54BCT543JT  SN54BCT543W  SN74BCT543  SN74BCT543DW  SN74BCT543DWE4  
SN74BCT543NTE4 PDF
Vicor
Vicor
VI-2NTEV DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create synchronous
arrays capable of supplying several kilowatts of output power.

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT, AUSTEL
■Up to 90% Efficiency
■Size: 4.6" x 2.4" x 0.5" (116,8 x 61,0 x 12,7)
■Remote Sense and Current Limit
■OVP, Thermal Shutdown
■Logic Disable
■Wide Range Output Adjust
■Compatible Power Booster Modules
■ZCS Power Architecture
■Low Noise FM Control
■CE Marked


other parts : VI-200CU  VI-200CV  VI-200CW  VI-200CX  VI-200CY  VI-200EU  VI-200EV  VI-200EW  VI-200EX  VI-200EY  
VI-2NTEV PDF
TI
Texas Instruments
SN74BCT8245ANTE4 SCAN TEST DEVICES WITH OCTAL BUFFERS

description
The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitryis accomplished via the 4-wire test access port (TAP) interface.

Members of the Texas Instruments SCOPE™Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to ’F245 and ’BCT245 in the Normal- Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPE™Instruction Set
− IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation From Outputs
− Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)


other parts : 5962-9172801Q3A  5962-9172801QLA  BCT8245A  SN54BCT8245A  SN74BCT8245A  SN74BCT8245ADW  SN74BCT8245ADWE4  SN74BCT8245ADWG4  SN74BCT8245ADWR  SN74BCT8245ADWRE4  
SN74BCT8245ANTE4 PDF
TI
Texas Instruments
SN74ALS857NTE4 HEX 2-TO-1 UNIVERSAL MULTIPLEXERS WITH 3-STATE OUTPUTS

description
The ′ALS857 are hextuple 2-line to 1-line multiplexers with 3-state outputs. The devices can provide either true (COMP low) or inverted (COMP high) data at the Y outputs. In addition, the ′ALS857 perform the logical AND function (A • B) and the clear function as well. The four modes of operation are:
  • Select A-data inputs
  • Select B-data inputs
  • AND A inputs with B inputs
  • Clear
 
• Select True or Complementary Data
• Perform AND/NAND (Masking) of A or B Operand
• Cascadable to Expand Number of Operands
• Detect Zeros on A or B Operands
• 3-State Outputs Interface Directly With System Bus
• Package Options Include Plastic
   Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

 


other parts : 5962-87533013A  5962-8753301LA  SN54ALS857  SN54ALS857FK  SN54ALS857JT  SN74ALS857  SN74ALS857DW  SN74ALS857DWG4  SN74ALS857DWR  SN74ALS857DWRE4  
SN74ALS857NTE4 PDF
TI
Texas Instruments
SN74AS876NTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops feature 3-state outputs designed specifically as bus drivers. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

• 3-State Buffer-Type Outputs Drive Bus Lines Directly
• Bus-Structured Pinout
• Choice of True or Inverting Logic
   – SN54ALS874B, SN74ALS874B, SN74AS874 Have True Outputs
   – SN74ALS876A, SN74AS876 Have Inverting Outputs
• Asynchronous Clear
• Package Options Include Plastic Small-Outline (DW) Packages, Plastic (FN) and Ceramic (FK) Chip Carriers, and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

 


other parts : 84010013A  8401001KA  8401001LA  SN54ALS874B  SN54ALS874BFK  SN54ALS874BJT  SN74ALS874B  SN74ALS874BDW  SN74ALS874BDWE4  SN74ALS874BDWG4  
SN74AS876NTE4 PDF

1

2345678910 Next

New and Popular Datasheet

LM317  PN2222A  1N4007  LM324N  2SK1464  IRF3415SPBF  IRF3415PBF  TP3094V  DTA123JUA  BR82  CU3225K11G2_02  T16/12  STW57N65M5_12  B78476A8135A003  L4075  MJD210  MV5074C  TJA1020  FR307  INA-03184-TR1  MC3372P  LT5106D  AZ10LVEL33  GBU605_E10  MSL-854BV  BC846  L6386D  2SB911M  74ABT374AD,118  CR6202  TT92N16KOF  901-9201-2A  LP02U12S09  MOC3041S-M  L2N7003LT1  450-3078  V54C3128404VBGA  RX-2CS  NJM78M08FA  NCP623MN  NCP603  MMO140  MD90FF25J  LM9618  DDTC113ZKA  DDTC113ZKA-7  BTS133TC  74ABT374  74ABT374A  40T03S  2SC5259  2SC9018  MY1401A  M3886  TDA2030A  Part List  Manufacturers List 
  


Key Word
System  Voltage  Analog  Audio  Axial  Battery  Bipolar  Bridge  Camera  Chip  Clock  Color  Connector  Control  Controller  Converter  Counter  Crystal  Decoder  Digital 

@ 2014 - 2018  [ Home ] [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]