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TI
TITI
SN74AS874NTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops


other parts : 84010013A  8401001KA  8401001LA  SN54ALS874B  SN54ALS874BFK  SN54ALS874BJT  SN74ALS874B  SN74ALS874BDW  SN74ALS874BDWE4  SN74ALS874BDWG4  
SN74AS874NTE4 PDF
TI
TITI
SN74BCT652NTE4 OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

description
These devices consist of bus transceiver circuits, D-type flip-flops, and control circuitry arranged for
 multiplexed transmission of data directly from the data bus or from the internal storage registers.

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ
ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
Independent Registers and Enables for A and B Buses


other parts : 5962-9155301MKA  BCT652  SN54BCT652  SN54BCT652FK  SN54BCT652JT  SN54BCT652W  SN74BCT652  SN74BCT652DW  SN74BCT652DWE4  SN74BCT652DWG4  
SN74BCT652NTE4 PDF
Vicor
VicorVicor
VI-2NTEX DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create


other parts : VI-200CU  VI-200CV  VI-200CW  VI-200CX  VI-200CY  VI-200EU  VI-200EV  VI-200EW  VI-200EX  VI-200EY  
VI-2NTEX PDF
TI
TITI
SN74BCT8374ANTE4 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPEtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Members of the Texas Instruments SCOPEFamily of Testability


other parts : 5962-9172701Q3A  5962-9172701QLA  BCT8374A  SN54BCT8374A  SN54BCT8374AFK  SN54BCT8374AJT  SN74BCT8374A  SN74BCT8374ADW  SN74BCT8374ADWE4  SN74BCT8374ADWG4  
SN74BCT8374ANTE4 PDF
Vicor
VicorVicor
VI-JNTEY MiniMod DC-DC Converters 25 to 100 Watts

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT
■CE Marked
■Up to 90% Efficiency
■Size: 2.28" x 2.4" x 0.5" (57,9 x 61,0 x 12,7)
■Remote Sense and Current Limit
■Logic Disable
■Wide Range Output Adjust
■ZCS Power Architecture
■Low Noise FM Control


other parts : VI-J00  VI-J00-CW  VI-J00-CW-F1  VI-J00-CW-F2  VI-J00-CW-S  VI-JT3-EW  VI-J00-CX  VI-J00-CX-F1  VI-J00-CX-F2  VI-J00-CX-S  
VI-JNTEY PDF
TI
TITI
SN74ALS874BNTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops


other parts : 84010013A  8401001KA  8401001LA  SN54ALS874B  SN54ALS874BFK  SN54ALS874BJT  SN74ALS874B  SN74ALS874BDW  SN74ALS874BDWE4  SN74ALS874BDWG4  
SN74ALS874BNTE4 PDF
TI
TITI
TMP422AMDCNTEP ±1°C REMOTE TEMPERATURE AND ±2.5°C LOCAL TEMPERATURE SENSOR IN SOT23-8

DESCRIPTION
The TMP422 is a remote temperature sensor monitor with a built-in local temperature sensor. The remote temperature sensor diode-connected transistors are typically low-cost, NPN- or PNP-type transistors or diodes that are an integral part of microcontrollers, microprocessors, or FPGAs.
Remote accuracy is ±1°C for multiple IC manufacturers, with no calibration needed. The two-wire serial interface accepts SMBus write byte, read byte, send byte, and receive


other parts : TMP422-EP  V62/11618-01XE  
TMP422AMDCNTEP PDF
TI
TITI
SN74BCT543NTE4 OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS

description
The ′BCT543 octal transceiver contains two sets of D-type latches for temporary storage of data flowing in either direction. Separate latch-enable (LEAB or LEBA) and output-enable (OEAB or OEBA) inputs are provided for each register to permit independent control in either direction of data flow.
The A-to-B enable (CEAB) input must be low in order to enter data from A or to output data from B. If CEAB is low and LEAB is low, the A-to-B latches are transparent; a


other parts : 5962-9087001M3A  5962-9087001MKA  5962-9087001MLA  SN54BCT543  SN54BCT543FK  SN54BCT543JT  SN54BCT543W  SN74BCT543  SN74BCT543DW  SN74BCT543DWE4  
SN74BCT543NTE4 PDF
Vicor
VicorVicor
VI-2NTEV DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create


other parts : VI-200CU  VI-200CV  VI-200CW  VI-200CX  VI-200CY  VI-200EU  VI-200EV  VI-200EW  VI-200EX  VI-200EY  
VI-2NTEV PDF
TI
TITI
SN74BCT8245ANTE4 SCAN TEST DEVICES WITH OCTAL BUFFERS

description
The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitryis accomplished via the 4-wire test access port (TAP) interface.

Members of the Texas Instruments SCOPE™Family of Testability Products


other parts : 5962-9172801Q3A  5962-9172801QLA  BCT8245A  SN54BCT8245A  SN74BCT8245A  SN74BCT8245ADW  SN74BCT8245ADWE4  SN74BCT8245ADWG4  SN74BCT8245ADWR  SN74BCT8245ADWRE4  
SN74BCT8245ANTE4 PDF

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