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SCAN182245A

  

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Fairchild
Fairchild Semiconductor
SCAN182245A Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products


other parts : SCAN182245ASSC  SCAN182245AMTD  SCAN182245ASSCX  SCAN182245AMTDX  
SCAN182245A PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245A Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  SCAN182245BFCX  
SCAN182245A PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245AFC Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  
SCAN182245AFC PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245AFM Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  
SCAN182245AFM PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245AFCX Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  SCAN182245BFCX  
SCAN182245AFCX PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245ASSC Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  
SCAN182245ASSC PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245AFMX Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  SCAN182245BFCX  
SCAN182245AFMX PDF
Fairchild
Fairchild Semiconductor
SCAN182245ASSC Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products


other parts : SCAN182245A  SCAN182245AMTD  SCAN182245ASSCX  SCAN182245AMTDX  
SCAN182245ASSC PDF
Fairchild
Fairchild Semiconductor
SCAN182245AMTD Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products


other parts : SCAN182245A  SCAN182245ASSC  SCAN182245ASSCX  SCAN182245AMTDX  
SCAN182245AMTD PDF
National-Semiconductor
National ->Texas Instruments
SCAN182245ASSM Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ TRI-STATEÉ outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up TRI-STATE for hot insert
■ Member of National’s SCAN Products


other parts : SCAN182245A  SCAN182245AFCQB  SCAN182245AFCX  SCAN182245AFMQB  SCAN182245AFMX  SCAN182245ASSCQB  SCAN182245ASSCX  SCAN182245ASSMQB  SCAN182245ASSMX  SCAN182245BFCQB  
SCAN182245ASSM PDF
Fairchild
Fairchild Semiconductor
SCAN182245ASSCX Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products


other parts : SCAN182245A  SCAN182245ASSC  SCAN182245AMTD  SCAN182245AMTDX  
SCAN182245ASSCX PDF
Fairchild
Fairchild Semiconductor
SCAN182245AMTDX Non-Inverting Transceiver with 25Ω Series Resistor Outputs

General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products


other parts : SCAN182245A  SCAN182245ASSC  SCAN182245AMTD  SCAN182245ASSCX  
SCAN182245AMTDX PDF

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