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SN54ABT18504 Datasheet PDF - Texas Instruments

Part NumberSN54ABT18504 Texas-Instruments
Texas Instruments Texas-Instruments
SN54ABT18504 Datasheet PDF : SN54ABT18504 pdf   
SN74ABT18504 image

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

• Members of the Texas Instruments
   SCOPE ™ Family of Testability Products
• Members of the Texas Instruments
   Widebus ™ Family
• Compatible With the IEEE Standard
   1149.1-1990 (JTAG) Test Access Port and
   Boundary-Scan Architecture
• UBT ™ (Universal Bus Transceiver)
   Combines D-Type Latches and D-Type
   Flip-Flops for Operation in Transparent,
   Latched, or Clocked Mode
• Two Boundary-Scan Cells per I/O for
   Greater Flexibility
• State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
   Significantly Reduces Power Dissipation
• SCOPE ™ Instruction Set
   – IEEE Standard 1149.1-1990 Required
      Instructions, Optional INTEST, and
      P1149.1A CLAMP and HIGHZ
   – Parallel Signature Analysis at Inputs With
      Masking Option
   – Pseudo-Random Pattern Generation
      From Outputs
   – Sample Inputs/Toggle Outputs
   – Binary Count From Outputs
   – Device Identification
   – Even-Parity Opcodes
• Packaged in 64-Pin Plastic Thin Quad Flat
   Pack Using 0.5-mm Center-to-Center
   Spacings and 68-Pin Ceramic Quad Flat
   Pack Using 25-mil Center-to-Center


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