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Part Name(s) : ADC081500 ADC081500CIYB ADC081500DEV ADC081500EVAL National-Semiconductor
National ->Texas Instruments
Description : HIGH PERFORMANCE, LOW POWER, 8-BIT, 1.5 GSPS A/D CONVERTER View

General Description
The ADC081500 is a LOW POWER, HIGH PERFORMANCE CMOS analog-to-digital CONVERTER that digitizes signals to 8 bits resolution at sample rates up to 1.7 GSPS. Consuming a typical 1.2 W at 1.5 GSPS from a single 1.9 Volt supply, this device is guaranteed to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a HIGH 7.3 ENOB with a 748 MHz input signal and a 1.5 GHz sample rate while providing a 10-18 B.E.R. Output formatting is offset binary and the LVDS digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable output offset voltage between 0.8V and 1.2V.

Features
■ Internal Sample-and-Hold
■ Single +1.9V ±0.1V Operation
■ Choice of SDR or DDR output clocking
■ Multiple ADC Synchronization Capability
■ Guaranteed No Missing Codes
■ Serial Interface for Extended Control
■ Fine Adjustment of Input Full-Scale Range and Offset
■ Duty Cycle Corrected Sample Clock

Key Specifications
■ Resolution 8 Bits
■ Max Conversion Rate 1.5 GSPS (min)
■ Bit Error Rate 10-18 (typ)
■ ENOB @ 748 MHz Input 7.3 Bits (typ)
■ DNL ±0.15 LSB (typ)
POWER Consumption
■ — Operating 1.2 W (typ)
POWER Down Mode 3.5 mW (typ)

Applications
■ Direct RF Down Conversion
■ Digital Oscilloscopes
■ Satellite Set-top boxes
■ Communications Systems
■ Test Instrumentation

Part Name(s) : ADC081000 ADC081000CIYB ADC081000LEVAL ADC081000 ADC081000CIYB ADC08D1000DEV National-Semiconductor
National ->Texas Instruments
Description : HIGH PERFORMANCE, LOW POWER 8-BIT, 1 GSPS A/D CONVERTER View

General Description
The ADC081000 is a LOW POWER, HIGH PERFORMANCE CMOS analog-to-digital CONVERTER that digitizes signals to 8 bits resolution at sampling rates up to 1.6 GSPS. Consuming a typical 1.4 Watts at 1 GSPS from a single 1.9 Volt supply, this device is guaranteed to have no missing codes over the full operating temperature range.
   
Features
■ Internal Sample-and-Hold
■ Single +1.9V ±0.1V Operation
■ Adjustable Output Levels
■ Guaranteed No Missing Codes
LOW POWER Standby Mode
   
Applications
■ Direct RF Down Conversion
■ Digital Oscilloscopes
■ Satellite Set-top boxes
■ Communications Systems
■ Test Instrumentation
   

Part Name(s) : ADC10D1000CCMPR ADC10D1000CVAL ADC10D1000DAISY ADC10D1000QML-SP ADC10D1000CCMLS ADC10D1000CCMPRES TI
Texas Instruments
Description : LOW-POWER, 10-Bit, Dual 1-GSPS or Single 2-GSPS Analog-to-Digital CONVERTER View

Description
The ADC10D1000 is a 10-bit, LOW-POWER, HIGH PERFORMANCE CMOS analog-to-digital CONVERTER (ADC) with sampling rates of up to 1 GSPS in dual-channel mode or 2 GSPS in single-channel mode. The ADC10D1000 achieves excellent accuracy and dynamic PERFORMANCE while consuming a typical 2.9 W of POWER.
The ADC10D1000 provides a flexible LVDS interface, which has multiple SPI-programmable options to facilitate board design and FPGA/ASIC data capture. The LVDS outputs are compatible with IEEE 1596.3-1996 and support programmable common-mode voltage.
The product is packaged in a hermatic 376-pin column grid array (CCGA) that is thermally enhanced and rated over the temperature range of –55°C to +125°C.

Features
• Space Qualified
   – Total Ionizing Dose 100 krad(Si)
   – Single-Event Latch-Up 120 MeV-cm2/mg
   – Single-Event Functional-Interrupt Immune 120
      MeV-cm2/mg (see Radiation Reports)
• Configurable to Either 1-GSPS Dual ADC or 2-GSPS Interleaved
LOW POWER Consumption
• R/W SPI Interface for Extended Control Mode±
• Internally Terminated, Buffered, Differential
   Analog Inputs
• Test Patterns at Output for System Debug
• Programmable 15-Bit Gain and 12-Bit Plus Sign
   Offset Adjustments
• Option of 1:2 Demuxed or 1:1 Non-Demuxed
   LVDS Outputs
• Auto-Sync Feature for Multi-Chip Systems
• Single 1.9-V POWER Supply
• Thermally Enhanced Column-Grid-Array Package

Applications
• Wideband Communications
• Direct RF Down Conversion
• Star Tracker

Part Name(s) : DAC5670I DAC5670IGDJ DAC5670 TI
Texas Instruments
Description : 14-Bit 2.4-GSPS Digital-to-Analog CONVERTER View

Description
The DAC5670 is a 14-bit 2.4-GSPS digital-to-analog CONVERTER (DAC) with dual demultiplexed differential input ports. The DAC5670 is clocked at the DAC sample rate and the two input ports run at a maximum of 1.2 GSPS. An additional reference bit input sequence is used to adjust the output clock delay to the data source, optimizing the internal data latching clock relative to this reference bit with a delay lock loop (DLL). Alternatively, the DLL may be bypassed and the timing interface managed by controlling DATA setup and hold timing to DLYCLK.

Features
• 14-Bit Resolution
• 2.4-GSPS Maximum Update Rate Digital to Analog CONVERTER
• Dual Differential Input Ports
    – Even/Odd Demultiplexed Data
    – Maximum 1.2-GSPS Each Port, 2.4-GSPS Total
    – Dual 14-Bit Inputs + 1 Reference Bit
    – DDR Output Clock
    – DLL Optimized Clock Timing Synchronized to Reference Bit
    – LVDS and HyperTransport™ Voltage Level Compatible
    – Internal 100-Ω Terminations for Data and Reference Bit Inputs
• Selectable 2 Times Interpolation With Fs/2 Mixing
• Differential Scalable Current Outputs: 5 to 30 mA
• On-Chip 1.2-V Reference
• 3.3-V Analog Supply Operation
POWER Dissipation: 2 W
• 252-Ball GDJ Package

Applications
• Test and Measurement: Arbitrary Waveform Generator
• Communications


Part Name(s) : AD9625 AD9625-2.0EBZ AD9625BBPZ-2.0 AD9625BBPZRL-2.0 ADI
Analog Devices
Description : 12-Bit, 2.0 GSPS, 1.3 V/2.5 V Analog-to-Digital CONVERTER View

GENERAL DESCRIPTION
The AD9625 is a 12-bit monolithic sampling analog-to-digital CONVERTER (ADC) that operates at conversion rates of up to 2.0 giga samples per second (GSPS). This product is designed for sampling wide bandwidth analog signals up to the second Nyquist zone. The combination of wide input bandwidth, HIGH sampling rate, and excellent linearity of the AD9625 is ideally suited for spectrum analyzers, data acquisition systems, and a wide assortment of military electronics applications, such as radar and jamming/antijamming measures.

FEATURES
12-bit 2.0 GSPS ADC, no missing codes
SFDR = 80 dBc, AIN up to 1 GHz at −1 dBFS, 2.0 GSPS
SFDR = 76 dBc, AIN up to 1.8 GHz at −1 dBFS, 2.0 GSPS
SNR = 59 dBFS, AIN up to 1 GHz at −1 dBFS, 2.0 GSPS
SNR = 58 dBFS, AIN up to 1.8 GHz at −1 dBFS, 2.0 GSPS
Noise floor = −149.5 dBFS/Hz at 2.0 GSPS
POWER consumption: 3.5 W at 2.0 GSPS
Differential analog input: 1.1 V p-p
Differential clock input
HIGH speed 6- or 8-lane JESD204B serial output Subclass 1: 5.0 Gbps at 2.0 GSPS
Two independent decimate by 8 or decimate by 16 filters  with 10-bit NCOs
Supply voltages: 1.3 V, 2.5 V
Serial port control
  Flexible digital output modes
  Built-in selectable digital test patterns

Part Name(s) : DAC5681Z DAC5681ZIRGCR DAC5681ZIRGCT DAC5681ZI TI
Texas Instruments
Description : 16-Bit, 1.0 GSPS 2x to 4x Interpolating Digital-To-Analog CONVERTER (DAC) View

Description
The DAC5681Z is a 16-bit 1.0 GSPS digital-to-analog CONVERTER (DAC) with wideband LVDS data input, integrated 2x to 4x interpolation filters, on-board clock multiplier, and internal voltage reference. The DAC5681Z offers superior linearity, noise, crosstalk, and PLL phase noise PERFORMANCE

Features
• 16-Bit Digital-to-Analog CONVERTER (DAC)
• 1.0 GSPS Update Rate
• 16-Bit Wideband Input LVDS Data Bus
    – 8 Sample Input FIFO
HIGH PERFORMANCE
    – 73-dBc ACLR WCDMA TM1 at 180 MHz
• 2x to 32x Clock Multiplying PLL/VCO
• 2x or 4x Interpolation Filters
    – Stopband Transition 0.4–0.6 Fdata
    – Filters Configurable in Either LOW-Pass or HIGH-Pass Mode
        – AlLOWs Selection of HIGHer Order Image
• On-Chip 1.2-V Reference
• 2 to 20-mA Differential Scalable Output
• 64-Pin 9-mm × 9-mm VQFN Package

Applications
• Cellular Base Stations
• Broadband Wireless Access (BWA)
• WiMAX 802.16
• Fixed Wireless Backhaul
• Cable Modem Termination System (CMTS)

Part Name(s) : 5962-0724701VXA DAC5670-SP DAC5670MGEM/EM DAC5670MGEM-V TI
Texas Instruments
Description : 14-Bit 2.4-GSPS Digital-to-Analog CONVERTER (DAC) View

Description
The DAC5670 is a 14-bit 2.4-GSPS DAC with dual demultiplexed differential input ports. The DAC5670 is clocked at the DAC sample rate and the two input ports run at a maximum of 1.2 GSPS. An additional reference bit input sequence is used to adjust the output clock delay to the data source, optimizing the internal data latching clock relative to this reference bit with a delay lock loop (DLL). Alternatively, the DLL may be bypassed and the timing interface managed by controlling DATA setup and hold timing to DLYCLK.

Features
• 14-Bit Resolution
• 2.4-GSPS Max Update Rate DAC
• Dual Differential Input Ports
    – Even/Odd Demultiplexed Data
    – Maximum 1.2 GSPS Each Port, 2.4 GSPS Total
    – Dual 14-Bit Inputs + 1 Reference Bit
    – DDR Output Clock
    – DLL Optimized Clock Timing Synchronized to Reference Bit
    – LVDS and HyperTransport™ Voltage Level Compatible
    – Internal 100-Ω Terminations for Data and Reference Bit Inputs
• Selectable 2× Interpolation With Fs / 2 Mixing
• Differential Scalable Current Outputs: 5 to 30 mA
• On-Chip 1.2-V Reference
• 3.3-V Analog Supply Operation
POWER Dissipation: 2 W
• 192-Ball CBGA (GEM) Package
• QML-V Qualified, SMD 5962-07247
• Military Temperature Range (–55°C to 125°C Tcase)

Applications
• Test and Measurement: Arbitrary Waveform Generator
• Communications
• Engineering evaluation (/EM) samples are available

Part Name(s) : DAC5682 DAC5682Z DAC5682ZIRGC25 DAC5682ZIRGCR DAC5682ZIRGCRG4 DAC5682ZIRGCT DAC5682ZIRGCTG4 TI
Texas Instruments
Description : 16-BIT, 1.0 GSPS 2x-4x INTERPOLATING DUAL-CHANNEL DIGITAL-TO-ANALOG CONVERTER (DAC) View

DESCRIPTION
The DAC5682Z is a dual-channel 16-bit 1.0 GSPS digital-to-analog CONVERTER (DAC) with wideband LVDS data input, integrated 2x/4x interpolation filters, on-board clock multiplier and internal voltage reference. The DAC5682Z offers superior linearity, noise, crosstalk and PLL phase noise PERFORMANCE.

FEATURES
• 16-Bit Digital-to-Analog CONVERTER (DAC)
• 1.0 GSPS Update Rate
• 16-Bit Wideband Input LVDS Data Bus
   – 8 Sample Input FIFO
   – Interleaved I/Q data for Dual-DAC Mode
HIGH PERFORMANCE
   – 73 dBc ACLR WCDMA TM1 at 180 MHz
• 2x-32x Clock Multiplying PLL/VCO
• 2x or 4x Interpolation Filters
   – Stopband Transition 0.4–0.6 Fdata
   – Filters Configurable in Either LOW-Pass or HIGH-Pass Mode
      – AlLOWs Selection of HIGHer Order Image
• Fs/4 Coarse Mixer
• On Chip 1.2 V Reference
• Differential Scalable Output: 2 to 20 mA
• Package: 64-Pin 9 × 9 mm QFN

APPLICATIONS
• Cellular Base Stations
• Broadband Wireless Access (BWA)
• WiMAX 802.16
• Fixed Wireless Backhaul
• Cable Modem Termination System (CMTS)

Part Name(s) : SPT7610 SPT7610SIQ Fairchild
Fairchild Semiconductor
Description : 6-BIT, 1 GSPS FLASH A/D CONVERTER View

GENERAL DESCRIPTION
The SPT7610 is a full parallel (flash) analog-to-digital CONVERTER capable of digitizing full-scale (0 to –1 V) inputs into six-bit digital words at an update rate of 1 GSPS. The ECL-compatible outputs are demultiplexed into two separate output banks, each with differential data-ready outputs to ease the task of data capture. The SPT7610’s wide input bandwidth and LOW capacitance eliminate the need for external track-and-hold amplifiers for most applications. A proprietary decoding scheme reduces metastable errors to the 1 LSB level. The SPT7610 operates from a single –5.2 V supply, with a nominal POWER dissipation of 2.75 W.

FEATURES
• 1:2 demuxed ECL-compatible outputs
• 1.0 GSPS conversion rate
• Wide input bandwidth: 1.4 GHz
LOW input capacitance: 8 pF
• Metastable errors reduced to 1 LSB
• Monolithic construction
• Binary/Two’s complement output

APPLICATIONS
• Radar, EW, ECM
• Direct RF down-conversion
• Microwave modems
• Industrial ultrasound
• Transient capture
• Test and measurement

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